Features

Virtual WDS features for spectral analysis.

Virtual WDS brings composition, spectrometer geometry, spectral profiles, and acquisition parameters into the same analysis. Use it to investigate the choices behind a wavelength-dispersive measurement, from a candidate X-ray line to its background and detector settings.

01 / Line and crystal selection

Which line offers the most useful measurement?

Compare candidate X-ray lines across available crystals and spectrometers. Inspect overvoltage ratio, full width at half maximum (FWHM), intensity per unit beam current, and peak-to-background ratio before examining the spectral profile.

Compare α and β lines on alternative analyzing crystals.
Explore accelerating voltage and the resulting excitation conditions.
Configure crystal availability, counter types, and spectrometer ranges.

Vanadium Kα and Kβ alternatives on LiF and PET, with overvoltage, FWHM, intensity, and peak-to-background values. — Vanadium line and crystal alternatives at 20 kV. The displayed values are estimates for the selected configuration. View full screenshot

02 / Composition and interference

Which elements could contribute to this spectral region?

Select an analytical element and inspect potential interfering elements in the periodic table. Distinguish first-order from higher-order contributions, then overlay selected profiles to examine their positions and relative intensities.

Enter elemental concentrations, a chemical formula, or a predefined matrix.
Display selected interferences or fetch all potential interferences.
Inspect absorption-edge markers when evaluating the background.

Periodic table showing vanadium as the analytical element, titanium selected as an interference, and other potential interfering elements. — The interference map for the vanadium example. The two selected elements use separate 100% reference concentrations. View full screenshot

03 / Pulse-height analysis

What does the PHA window admit?

Inspect simulated pulse-height distributions and adjust the lower threshold and upper level or window width. Apply the selected PHA conditions to the spectral plot to investigate their effect on admitted counts and higher-order contributions.

Inspect the fraction of each displayed order within the PHA window.
Compare spectra with PHA enabled or disabled.
Relate the distribution to the selected line, crystal, and counter.

Pulse-height distribution for vanadium Kα on PET with an argon detector and adjustable lower threshold, window width, and upper level. — Vanadium Kα on PET with an argon detector. The controls define the accepted pulse-height interval. View full screenshot

Background placement

Set low and high background positions as offsets or absolute positions. Examine neighboring profiles and continuum contributions at the peak and backgrounds, and explore the available background-optimization criteria.

Counting strategy

Explore the allocation of counting time between the peak and backgrounds. Estimate precision and detection limits for a specified composition, beam current, and counting time, or investigate the time needed for a chosen target.

Instrument and display configuration

Set crystals, counter types, spectrometer range, and multilayer spacing. View spectral positions in sin θ, 2θ, wavelength, or energy, with linear or logarithmic intensity scales.

EDS spectra

Generate an energy-dispersive spectrum from the selected composition. Explore accelerating voltage, detector window, energy resolution, and escape-peak display alongside the WDS investigation.

Interpreting the simulation. First-order peaks are based on stored experimental profiles; higher-order profiles are calculated. Peak shapes and intensities are approximate and may differ between instruments. Continuum and counting estimates depend on the model and composition. Use these results to guide analytical strategy, and verify measurement conditions and corrections on the instrument.

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